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Li, C. (2026) “A Review of Reliability and Failure Mechanisms of SiC MOSFETs and GaN HEMTs in High-Power-Density Power Electronic Systems”, CPS Digital Library - Series of Conferences, (2), pp. 319–331. Available at: https://seriesofconference.com/index.php/SCJ/article/view/526 (Accessed: 25 October 2026).